Pay in 4 interest-free payments of $70.80 Learn more
Ships within 48 hours · Estimated delivery Aug 26 - Aug 31
These probesare ideal for C-AFM
Micron Locater Grids
sample preparation
Surfaces do not have to be prepared prior to application and will adhere to such materials as polymer (phenolic) boards
Mo with 4 posts
Aluminum-Tungsten Dendrites Silicon Dioxide Support Films These probesare ideal for C-AFMDESCRIPTION medium resolution test for Scanning Electron Microscopy Aluminum Tungsten Dendrites Test Standard The various spacings created by the dendritic structure give the gap test. The topographical arrangement of dendrites leads to the gray level test. The specimen is non magnetic, vacuum clean, has no adverse reaction to the electron probe and requires no surface coating. It is most useful for working in the probe size range of 25 to 75nm. This
US$ 287.50
US$ 162.50
US$ 187.50
US$ 150.00
US$ 235.00
US$ 800.00
US$ 150.00
US$ 150.00
