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tapping and other modes with image sizes from 500nm to 20um
Each pattern has 5 bars and spaces with equal pitch: 500nm
QS-9000 and ISO-17025
Tilt-Compensated High Aspect Ratio (5:1) Focused Ion Beam (FIB) probes for high resolution TappingMode imaging on samples with tall/deep geometries
Note: Requires specialized probe holder (part of the VITA module) when used with Innova AFM
NCLV Wear Resistant tapping and other modes with48N m, 190kHz, No Reflective Coat, 10Pk DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of Silicon Probes. Quantity=10 Bruker's Value Line Long Lever TappingMode imaging probes. This probe is also available with Aluminum reflex coating as model NCLV A. Specifications: 48N m, 190kHz, No Reflective Coating. Unmounted for use on any AFM. Tip Geometry: Standard (Steep) Tip Height: 10 15 Front Angle: 25 2. 5 Back Angle: 15 2. 5 Side Angle:
