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For use only on ScanAsyst-enabled Dimension Icon
Version with a 500-200-100nm structure
and polyethylene terephthalate (PET
Structure: Si wafer with grating in top surface Pattern type: Array of sharp tips Tip angle: About 50 degrees Tip Radius: ≤10nm Tip Height: 0
The Pt-Ir coating on the front side of the cantilever provides a metallic electrical path from the cantilever die to the apex of the tip
NCHV-A nanoTA and STHM Samples For use only on ScanAsyst-enabled40N m, 320kHz, Al Reflective Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of Silicon Probes. Quantity=10 Bruker's Value Line etched silicon probes for imaging in TappingMode and non contact mode in air, with reflective coating. This probe is also available without Aluminum reflex coating as model NCHV. Specifications: 40N m, 320kHz, Al Reflective Coating. Unmounted for use on any AFM. Tip Geometry: Standard (Steep)
