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Max Overhang = 30 nm
Check Scan line profile and enlarged view of the tip apex
3 cantilevers: 0
Improved probe quality and aesthetics
5 Back Angle: 15 ± 2
SD-103 Hi-Res Max Overhang = 30 nmSPM cross sectional sample holder DESCRIPTION SPM cross sectional sample holder for all Veeco SPMs. This cross sectional sample holder is designed to hold a wafer cross section upright for edge inspection and it can be used on all microscopes; However, cross section cannot be taller than the height supported by the microscope. It is 0. 5" in diameter and 0. 175" tall. Includes a hex key.
US$ 22.00
US$ 24.00
US$ 34.99
US$ 2101.32
