25 N/m spring constant for reliable highest resolution imaging on any sample
VITA nTA Calibration Sample Set DESCRIPTION
5 Tip Radius (Nom): 2 Tip Radius (Max): 12 Tip Set Back (Nom): 5 Tip Set Back( RNG): 3 - 7
55 Cantilever Geometry: Rectangular Cantilevers Number: 1
These SPM Calibration Gratings are designed specifically for three dimensional monitoring and calibration of scanning probe microscopes
FIB6-400A 110 kHz 25 N/m spring constant for42N m, 320kHz, 10nm Tip Radius, 400nm Wide Spike @ 6m, Al reflective coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS 42N m, 320kHz, 10nm Tip Radius, 400nm Wide Spike @ 6m, Al reflective coating High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 15: 1 at 6um from tip apex. Tip Geometry: High Aspect Ratio Tip Height: 10 15 Front Angle: 1. 7 Back Angle: 11 31 Side Angle: 1. 7 Tip Radius (Nom): 10