292nm Pitch High Magnification, High Resolution Calibration Standard for SEM, Auger and FIB PELCO® Special Metal Grids 5mm square and is unmounted

5mm square and is unmounted

10 & 20nm range

and an entry hole for counter and reference electrodes are integrated into the glass fluid cell

AFM: use in contact

cross-section cannot be taller than the height supported by the microscope

292nm Pitch High Magnification, High Resolution Calibration Standard for SEM, Auger and FIB PELCO® Special Metal Grids 5mm square and is unmountedDESCRIPTION Precision holographic grating standard with high contrast and excellent edge definition. Period: 292nm pitch nominal, one dimensional array. Accuracy is + 1%. Calibration certificate will give the actual pitch of the standard. Surface structure: Titanium lines on Silicon, 4x3mm dimensions. Line height (about 30nm) and line width (130nm) are not calibrated. Usability: The calibrated pattern covers the entire chip. There is sufficient usable