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For non-electrical applications where wear resistance is required
PtIr Conductive Coating
the tobacco mosaic virus is undamaged by blunt tips but is compressed or disintegrated under sharper scanning styli
useful for EDX analysis
pitch size is selectable from 2µm to 15µm
Test Grating for Tip Sharpness Hysitron For non-electrical applications where wearDESCRIPTION The TGTZ 400 test grating is intended for 3 D visualization of the scanning tip, determination of tip sharpness parameters, tip degradation and contamination control. Structure: Si wafer with grating in top surface Pattern type: Array of sharp tips Tip angle: About 50 degrees Tip Radius: 10nm Tip Height: 0. 3 0. 7m Period: 3 0. 01m Diagonal period: 2. 12m Chip size: 5 x 5 x 0. 5mm Effective area: Central square of 2 x 2mm
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