DDLTESP-V2 Unmounted Tighter dimensional specifications for improved

Tighter dimensional specifications for improved probe to probe consistency

Bruker’s new line of FESP high quality premiumetched silicon probes set the industry standard for soft TappingMode imaging and force modulation in air

- Pin-premounted for easier and safer handling

025 Ωcm Antimony (n) doped Si Cantilever Thickness (Nom): 6

Mica Sample

DDLTESP-V2 Unmounted Tighter dimensional specifications for improvedDESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Brukers new series of conductive diamond coated probes provide consistent performance with high wear resistance in mechanical and electrical applications. In mechanical applications, these probes provide extreme wear resistance. On a Bruker Dimension Icon with FASTForce Volume Contact Resonance, these probes provide consistent results over many dozens of images. In electrical applications, these