Carbon Mount 31.7mm, Cambridge S-4 SEM Specimen Mounts Pin Mount adapter to JEOL

Pin Mount adapter to JEOL 12

Clip width is 6

Tip-evaluation software provides on-command "worst case" probe-shape diagnosis based on scanning of this roughness sample

2mm) pin on JEOL SEMs (including JEOL NEOSCOPE)

For a less expensive uncalibrated version of this probe

Carbon Mount 31.7mm, Cambridge S-4 SEM Specimen Mounts Pin Mount adapter to JEOLDESCRIPTION All our carbon SEM specimen mounts are made from spectrographically pure, the highest purity grade, graphite rods. Total impurity level does not exceed 2ppm and typically less than 1ppm per element. These mounts are ideal for analytical SEM and microprobe work since the only element which can be detected with EDS or WDS systems in their specimen mounts is C. Both electron and X ray absorption is much higher than compared with the standard