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Multi75GD-G Select Quantity:10 per set 15487 - Low Profile PELCO®

SKU: 92898091852

4.2
USD223.40 USD245.40

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Ships within 48 hours · Estimated delivery Aug 29 - Sep 3

Description

15487 - Low Profile PELCO® Single 1/2" FIB Sample and Grid Holder

0 Front Angle: 15 ± 2

NIST traceable version is Pelcotec™ G-1T

electrically conductive tip that is ideal for Electrical Force Microscopy (EFM)

Maximum gap is 11mm (7/16")

Multi75GD-G Select Quantity:10 per set 15487 - Low Profile PELCO®Gold Coated Force Modulation AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Gold Coated Force Modulation AFM Probe Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM) in air and liquids. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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