MSNL-10 2 nm These probes are tailored for

These probes are tailored for specific high resolution electrical measurements by matching the softness of a nitride cantilever with the sharpness of an uncoated silicon probe

3e-13 EMU (low)

5 Side Angle: 22

Recommended for use with Bruker Dimension FastScan AFM

5+/-5 Tip Radius (Nom): 20 Tip Coating: Highly conductive single cystal diamond Tip Set Back (Nom): 15-25 Tilt Compensation: 1 +/- 1

MSNL-10 2 nm These probes are tailored for6 levers, 0. 01 0. 50N m, Au Reflex Coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Bruker's Sharp Microlever (MSNL) probes are the industry standard forhigh performance imaging with TappingMode in fluid. These probes marrythe sharpness of a Silicon tip with the low spring constant and highsensitivity of a Silicon Nitride cantilever, for an unprecedented levelof high resolution and force control on just about any sample, in anymedium.